Byeongju Cha


Email : byjcha at gmail dot com

Linkedin profile



I received Ph.D in Electrical Engineering from the University of Southern California, Los Angeles, in 2015 and am currently with Oracle Corporation, Santa Clara, California, since February 2015.
During the graduate program, my research was focused on fault-tolerant design of microprocessors and hardware security.

Prior to joining the Ph.D program at the University of Southern California, I obtained B.S from Seoul National University, Seoul, South Korea, in 2007 and served as an intelligent officer in ROKA in an artillery battalion from 2007 to 2009 (final rank: 1LT; mandatory military service. For more details, please read [ROKA]).

Education

Ph.D in Electrical Engineering, 2015, University of Southern California, Los Angeles, CA, USA
Advisor: Professor Sandeep K. Gupta
Dissertation title: Trustworthiness of Integrated Circuits: A New Testing Framework for Hardware Trojans

M.S. in Electrical Engineering, 2011, University of Southern California, Los Angeles, CA, USA

B.S. in Electrical Engineering, 2007, Seoul National University, Seoul, Republic of Korea (South Korea)

Experiences

Senior Hardware Engineer, Oracle Corporation, 2015-Present, Santa Clara, CA, USA

Intern, Nvidia Corporation, 2014, Santa Clara, CA, USA

Intelligent Officer, 2007-2009, Republic of Korea Army, YeonCheon, Republic of Korea (South Korea)

Publications

[1] Byeongju Cha and Sandeep K. Gupta, "A Resizing Method to Minimize Effects of Hardware Trojans," IEEE Asian Test Symposium (ATS), 2014, pp. 192-199.

[2] Byeongju Cha and Sandeep K. Gupta, "Trojan detection via delay measurements: A new approach to select paths and vectors to maximize effectiveness and minimize cost," Design, Automation and Test in Europe (DATE), 2013, pp. 1265-1270.

[3] Byeongju Cha and Sandeep K. Gupta, "Efficient Trojan detection via calibration of process variations," IEEE Asian Test Symposium (ATS), 2012, pp. 351-361.

[4] Jianwei Zhang, Byeongju Cha, and Sandeep K. Gupta, "Reduced-Complexity Trojan Detection Method via Delay Measurements," IEEE workshop on Silicon Debug and Diagnosis (SDD), 2012.

[5] Hsunwei Hsiung, Byeongju Cha, and Sandeep K. Gupta, "Salvaging chips with caches beyond repair," Design, Automation and Test in Europe (DATE), 2012, pp. 1263-1268.


Last updated on 04-16-15